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Last updated:

August 30, 2022

Duration:

Unlimited Duration

FREE

This course includes:

Unlimited Duration

Badge on Completion

Certificate of completion

Unlimited Duration

Description

6.780 covers statistical modeling and the control of semiconductor fabrication processes and plants.

Topics covered include: design of experiments, response surface modeling, and process optimization; defect and parametric yield modeling; process/device/circuit yield optimization; monitoring, diagnosis, and feedback control of equipment and processes; and analysis and scheduling of semiconductor manufacturing operations.

Course Curriculum

  • Overview of Semiconductor Manufacturing Unlimited
    • Statistics Review: Distributions Unlimited
    • Statistics Review: Estimation Unlimited
    • Hypothesis Tests and Control Chart Introduction Unlimited
    • Advanced Control Charts, Nested Variance Unlimited
    • Analysis and Design of Experiments Unlimited
    • MANOVA, Factorial Experiments Unlimited
    • Design of Experiments and Response Surface Modeling Unlimited
    • RSM and Regression Unlimited
    • Sensors and Signals Unlimited
    • Run by Run Control Unlimited
    • Scheduling Unlimited
    • Factory Design and Efficiency Unlimited

About the instructor

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Courses

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Massachusetts Institute of Technology