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Created by:
Last updated:
August 30, 2022
Duration:
Unlimited Duration
FREE
This course includes:
Unlimited Duration
Badge on Completion
Certificate of completion
Unlimited Duration
Description
6.780 covers statistical modeling and the control of semiconductor fabrication processes and plants.
Topics covered include: design of experiments, response surface modeling, and process optimization; defect and parametric yield modeling; process/device/circuit yield optimization; monitoring, diagnosis, and feedback control of equipment and processes; and analysis and scheduling of semiconductor manufacturing operations.
Course Curriculum
- Overview of Semiconductor Manufacturing Unlimited
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- Statistics Review: Distributions Unlimited
- Statistics Review: Estimation Unlimited
- Hypothesis Tests and Control Chart Introduction Unlimited
- Advanced Control Charts, Nested Variance Unlimited
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- Analysis and Design of Experiments Unlimited
- MANOVA, Factorial Experiments Unlimited
- Design of Experiments and Response Surface Modeling Unlimited
- RSM and Regression Unlimited
- Scheduling Unlimited
- Factory Design and Efficiency Unlimited
About the instructor
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Massachusetts Institute of Technology
